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X-ray inline thickness measuring equipment

Model: DVT-CHX-3000

Category: Optical Instruments

Exhibitor:

WUXI DYNAVISION MIYAHARA CO., LTD.

Booth No: B501

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Description
The measurement employs X-ray transmission absorption, with the direct physical parameter being areal density (basis weight). As X-rays penetrate the material, they undergo reflection, scattering, or absorption, resulting in intensity attenuation that is positively correlated with the material's areal density. When the material's volumetric density remains constant or highly consistent, thickness can be derived through conversion (areal density = density × thickness). This method is applied for online measurement and control of areal density (thickness) uniformity across various sheet, web, or coated materials, including plastic films, nonwovens, metal foils, and rubber.

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