Surface finish detection system of high-voltage cable semiconductive material strip

1. High-precision Surface Defect Detection
Accurately identifies tiny protrusions, particles and bulges on extruded thin layers of semi-conductive shielding compound.

2. Non-contact Nondestructive Testing
Non-contact detection keeps samples intact without damaging the surface.

3. High-sensitivity Real-time Scanning
Continuous real-time scanning with fast response to capture subtle transient surface defects.

4. Intelligent Data Analysis & Recording
Automatically counts defects, records position and dimension, supporting full data traceability.

5. Specially Adapted for Cable Semi-conductive Shielding Compound
Designed for R&D testing of HV cable semicon shielding materials, compatible with various extruded thin specimens.

6. Simple Operation & High Testing Efficiency
One-click testing procedure, ideal for frequent lab quality inspection and formulation comparison.

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